Surface analysis : the principal techniques.
by
Vickerman, J. C.
Title
:
Surface analysis : the principal techniques.
Author
:
Vickerman, J. C.
ISBN
:
9780470017630
9780470017647
Edition
:
2nd ed. / editors, John C. Vickerman, Ian Gilmore.
Publication Information
:
Chichester : Wiley, c2009.
Physical Description
:
xix, 666 p. : ill. ; 25 cm.
General Note
:
Formerly CIP.
Contents
:
1. Introduction / John C. Vickerman -- 2. Auger Electron Spectroscopy / Hans Jorg Mathieu -- 3. Electron Spectroscopy for Chemical Analysis / Buddy D. Ratner and David G. Castner -- 4. Molecular Surface Mass Spectrometry by SIMS / John C. Vickerman -- 5. Dynamic SIMS / David McPhail and Mark Dowsett -- 6. Low-Energy Ion Scattering and Rutherford Backscattering / Edmund Taglauer -- 7. Vibrational Spectroscopy from Surfaces / Martyn E. Pemble and Peter Gardner -- 8. Surface Structure Determination by Interference Techniques / Christopher A. Lucas -- 9. Scanning Probe Microscopy / Graham J. Leggett -- 10. The Application of Multivariate Data Analysis Techniques in Surface Analysis / Joanna L. S. Lee and Ian S. Gilmore -- Appendix 1. Vacuum Technology for Applied Surface Science / Rod Wilson -- Appendix 2. Units, Fundamental Physical Constants and Conversions.
Subject Term
:
Surfaces (Physics)
Added Author
:
Vickerman, J. C.
Gilmore, Ian.
| Library | Material Type | Item Barcode | Shelf Number | Copy |
|---|
| IIEMSA | General Books | 33168025423993 | 530.417 V637S 2009 | 1 |