Wire bonding in microelectronics
by
 
Harman, George G.

Title
Wire bonding in microelectronics

Author
Harman, George G.

ISBN
9780071476232
 
9780071703345
 
9780071701013

Personal Author
Harman, George G.

Edition
3rd ed.

Publication Information
New York : McGraw-Hill, ©2010.

Physical Description
xx, 426 pages : illustrations ; 24 cm + 1 CD-ROM (4 3/4 in.)

General Note
Revised edition of: Reliability and yield problems of wire bonding in microelectronics. 1989.
 
CD includes all the book's full-color figures plus animations.

Contents
The technical introduction to the third edition -- Ultrasonic bonding systems and technologies, including a description of the ultrsonic wire bonding mechanism -- Bonding wire metallurgy and characteristics that can affect bonding, reliability, or testing -- Wire bond testing -- Gold-Aluminum intermetallic compounds and other metallic interface reactions in wire bonding -- Introduction to plating, setion A (gold) and section B (nickel-based) bond pad technology and reliability -- Cleaning to improve bondability and reliability -- Mechanical problems in wire bonding -- Advanced and specialized wire bonding technologies -- An overview of the materials and material science of copper, low-k devices that affect bonding and packaging -- Wire bonding process modeling and simulation.

Subject Term
Wire bonding (Electronic packaging) -- Production control.
 
Electronic packaging -- Reliability.
 
Electronic packaging -- Defects.
 
Semiconductors -- Failures.

Added Author
Harman, George G. Reliability and yield problems of wire bonding in microelectronics.


LibraryMaterial TypeItem BarcodeShelf NumberCopy
IIEMSAGeneral Books33168025788197621.381 H254W 20101