Wire bonding in microelectronics
by
Harman, George G.
Title
:
Wire bonding in microelectronics
Author
:
Harman, George G.
ISBN
:
9780071476232
9780071703345
9780071701013
Personal Author
:
Harman, George G.
Edition
:
3rd ed.
Publication Information
:
New York : McGraw-Hill, ©2010.
Physical Description
:
xx, 426 pages : illustrations ; 24 cm + 1 CD-ROM (4 3/4 in.)
General Note
:
Revised edition of: Reliability and yield problems of wire bonding in microelectronics. 1989.
CD includes all the book's full-color figures plus animations.
Contents
:
The technical introduction to the third edition -- Ultrasonic bonding systems and technologies, including a description of the ultrsonic wire bonding mechanism -- Bonding wire metallurgy and characteristics that can affect bonding, reliability, or testing -- Wire bond testing -- Gold-Aluminum intermetallic compounds and other metallic interface reactions in wire bonding -- Introduction to plating, setion A (gold) and section B (nickel-based) bond pad technology and reliability -- Cleaning to improve bondability and reliability -- Mechanical problems in wire bonding -- Advanced and specialized wire bonding technologies -- An overview of the materials and material science of copper, low-k devices that affect bonding and packaging -- Wire bonding process modeling and simulation.
Subject Term
:
Wire bonding (Electronic packaging) -- Production control.
Electronic packaging -- Reliability.
Electronic packaging -- Defects.
Semiconductors -- Failures.
Added Author
:
Harman, George G. Reliability and yield problems of wire bonding in microelectronics.
| Library | Material Type | Item Barcode | Shelf Number | Copy |
|---|
| IIEMSA | General Books | 33168025788197 | 621.381 H254W 2010 | 1 |