2 Results Found Subscribe to search results
00IIE
Print
2. 
Cover image for Wire bonding in microelectronics
by 
Harman, George G.
Format: 
Electronic Resources
Publication Date 
2010
Excerpt: 
characteristics that can affect bonding, reliability, or testing -- Wire bond testing -- Gold
Available: Copies:
Limit Search Results
Access Level
Format
Material Type
Language
Library
Shelf Location
Publication Date
Advanced Search Location