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Finkelstein, Maxim.
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Electronic Resources
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2010
Excerpt:
Failure Rate Modelling for Reliability and Risk Finkelstein, Maxim.
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Harman, George G.
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Electronic Resources
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2010
Excerpt:
Harman, George G. Reliability and yield problems of wire bonding in microelectronics.
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McTeigue, Jeanne, author.
Format:
Electronic Resources
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2015
Excerpt:
Liability, Legal -- United States.
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Ogunnaike, Babatunde A. (Babatunde Ayodeji)
Format:
Electronic Resources
Publication Date
2010
Excerpt:
: Statistics -- V. Applications -- 21. Reliability and Life Testing -- 22. Quality Assurance and Control -- 23
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Nevid, Jeffrey S.
Table of contents http://www.loc.gov/catdir/toc/ecip052/2004024788.html
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Electronic Resources
Publication Date
2006
Excerpt:
Assessment -- Reliability -- Validity -- Methods of Assessment -- The Clinical Interview -- Psychological
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Tian, Jeff.
123Library http://www.123library.org/book_details/?id=11533
Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=228492
Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=228492userid=^u
ebrary http://site.ebrary.com/id/10304972
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=131934
Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=228492
Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=228492userid=^u
ebrary http://site.ebrary.com/id/10304972
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=131934
Format:
Electronic Resources
Publication Date
2005
Excerpt:
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Electronic Resources
Publication Date
2003
Excerpt:
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Electronic Resources
Publication Date
2001
Excerpt:
-- Acceptance Sampling -- Reliability -- Design of Experiments -- Failure Mode and Effect Analysis -- Quality
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