IIE Logo

IIE
Switch to list view
Switch to thumbnail view
Select an Action
2 Results Found Subscribe to search results
00IIE
Print
1. 
Cover image for Quality management for organizational excellence : introduction to total quality
Quality management for organizational excellence : introduction to total quality
by 
Goetsch, David L.
Format: 
Books
Publication Date 
2014
Excerpt: 
-- Just-in-time/Lean manufacturing (JIT/Lean) -- Improving total quality management.
Available: Copies:
2. 
Cover image for The Oliver Wight ABCD checklist for operational excellence
The Oliver Wight ABCD checklist for operational excellence
by 
Wight, Oliver W.
Table of contents http://catdir.loc.gov/catdir/toc/onix06/00033007.html
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley042/00033007.html
Publisher description http://catdir.loc.gov/catdir/description/wiley035/00033007.html
Format: 
Books
Publication Date 
2000
Excerpt: 
Manufacturing resource planning.
Available: Copies:
Limit Search Results
Access Level
Author
Format
Item Category 1
Material Type
Language
Library
Shelf Location
Publication Date
Subject
Item Available
Advanced Search Location