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000000000IIE
Print
by 
Harman, George G.
Format: 
Electronic Resources
Publication Date 
2010
Excerpt: 
Harman, George G. Reliability and yield problems of wire bonding in microelectronics.
Available: Copies:
2. 
Cover image for PIC microcontrollers : an introduction to microelectronics
by 
Bates, Martin, 1952-
Format: 
Books
Publication Date 
2011
Excerpt: 
PIC microcontrollers : an introduction to microelectronics / Bates, Martin, 1952-
Available: Copies:
3. 
Cover image for Microelectronics : circuit analysis and design
by 
Neamen, Donald A.
Format: 
Books
Publication Date 
2010
Excerpt: 
Microelectronics : circuit analysis and design / Neamen, Donald A.
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4. 
Cover image for Microelectronic circuit design.
by 
Jaeger, Richard C.
Format: 
Books
Publication Date 
2016
Excerpt: 
Microelectronic circuit design. Jaeger, Richard C.
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by 
Zhao, Feng, author.
Format: 
Books
Publication Date 
2015
Excerpt: 
Electronics and Microelectronics, Instrumentation.
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by 
Baruah, Sanjoy.
Format: 
Books
Publication Date 
2015
Excerpt: 
Electronics and Microelectronics, Instrumentation.
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7. 
Cover image for Smart sensors and MEMS : intelligent devices and microsystems for industrial applications
by 
Nihtianov, Stoyan, editor.
Format: 
Regular print
Publication Date 
2014
Excerpt: 
engineers working in the microelectronics, sensors and micromechanics industry, and engineers looking for
Available: Copies:
by 
Meijer, G. C. M. (Gerard C. M.)
Format: 
Books
Publication Date 
2014
Excerpt: 
researchers in the microelectronics industry, including microsystem developers, will also find this a thorough
Available: Copies:
by 
Mathur, N.B.L
Format: 
Books
Publication Date 
2010
Excerpt: 
Introduction to Digital Microelectronic Circuits Mathur, N.B.L
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